Instruments
Materials Analysis SEF
This facility is oriented toward multiple-technique characterization of a variety
of solid surfaces with regard to atomic structure, surface chemical composition,
and chemical bonding characteristics.
Electron Microscopy SEF
This facility provides instrumentation and expertise to the MIT and general
academic community for the performance of top-class electron microscopy and
associated procedures.
Crystal Growth SEF
This facility offers equipments and expert consultation to the MIT and general
academic community on single crystal growth, processing and magnetic property
characterization.
X-ray Diffraction SEF
This facility provides a broad base of analytical x-ray support for researchers
needing both powder and single crystal diffractometry capabilities.
