MIT Electron Microprobe Facility: Training Courses
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Course 12.141 at MIT Open Courseware
Center for Geochemical Analysis
Experimental Petrology Laboratory

Outside links:
Microbeam Analysis Society
Microscopy Society of America

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The MIT Electron Microprobe Facility is dedicated to train users of different academic background in the theory and operation of the electron microprobe. In-depth and hands-on courses are offered both to students and professionals from the industry.

The credit-bearing course for students is offered in January during the Independent Activities Period (IAP). Although this course is designed for students, listeners are welcome from both inside and outside of MIT. A demo session is also organized to introduce new and prospective users of the electron microprobe to our facility.

Year 2008 Course Announcements

--------Visit the MIT Open Courseware website for course notes (You need Acrobat Reader to view the notes)
--------Visit the MIT IAP website for official course announcements (Course 12.141, Demo session)

 

Summer Short Course

--------This is a hands-on course for professionals from the industry. The availability of this course depends on interest level. Please contact us for details. One-to-one instructions are also available.

 

 

 

 

 

 

 

 

 

12.141
Electron Microprobe Analysis
 Prof. Tim Grove, Dr. Nilanjan Chatterjee
Tue, Thurs; Jan. 8,10,15,17; 1-5 pm; Rm 54-1221
Enrollment limited to 8 people
Enter lottery by Jan. 4
6 units, P/D/F grading

Introduction to the theory of x-ray microanalysis through Electron Microprobe including ZAF matrix corrections; techniques to be discussed are Wavelength and Energy Dispersive Spectrometry, Backscattered Electron, Secondary Electron, Cathodoluminescence and X-ray imaging; lab sessions will involve hands-on use of the JEOL JXA-733 Superprobe. This four-session course is offered for undergraduate credit. However, persons interested in an in-depth discussion of quantitative x-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit. Please submit following form, or call Dr. Chatterjee at 617-253-1995.

Name:
MIT ID#:
eMail:
Status (postdoc/grad/undergrad/freshman):
Department/Major:
You may when done, or if you want to start over.
Recommended reading:
  • Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Material Scientists, and Geologists, Goldstein et al., 1992, 2nd Edition, Plenum Press: New York.
  • Quantitative Electron-Probe Microanalysis, Scott, Love & Reed, 1995, 2nd Edition, Ellis-Horwood: New York.
  • Electron Micro-Probe Analysis and Scanning Electron Microscopy in Geology, Reed, 1996, Cambridge Univ. Press: Cambridge, U.K.

 

 

 

 

 

 

 

 

 

 

 

 

 

Electron Microprobe Analysis on the JEOL JXA-733 Superprobe
 Dr. Nilanjan Chatterjee
Fri; Jan. 11; 1-3 pm; Rm 54-1221
Non-credit activity

This session is to introduce new users to the JEOL JXA-733 Superprobe. You will have hands-on experience (if time permits) on our electron microprobe equipped with enhanced imaging capabilities and learn about wavelength and energy dispersive spectrometry, backscattered electron, secondary electron, cathodoluminescence, and elemental x-ray imaging. Please submit following form, or call Dr. Chatterjee at 617-253-1995.

Name:
eMail:
Status (postdoc/grad/undergrad):
Department/Major:
You may when done, or if you want to start over.

Send comments to e-probe-www@mit.edu

(Last Revised 11/29/2007 by Nilanjan Chatterjee)