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Contents
Index
8. Curve and Surface Interrogation
Subsections
- 8.1 Classification of interrogation methods
- 8.1.1 Zeroth-order interrogation methods
- 8.1.1.1 Wireframe
- 8.1.1.2 Contouring
- 8.1.2 First-order interrogation methods
- 8.1.2.1 Shading and ray tracing
- 8.1.2.2 Isophotes
- 8.1.2.3 Reflection lines
- 8.1.2.4 Highlight lines
- 8.1.3 Second-order interrogation methods
- 8.1.3.1 Curvature plots
- 8.1.3.2 Zero curvature points
- 8.1.3.3 Radial curves
- 8.1.3.4 Surface curvatures and curvature maps
- 8.1.3.5 Focal curves and surfaces
- 8.1.3.6 Orthotomics
- 8.1.3.7 Curvature lines
- 8.1.3.8 Geodesics
- 8.1.4 Third-order interrogation methods
- 8.1.4.1 Torsion of space curves
- 8.1.4.2 Stationary points of curvature of planar and space
curves
- 8.1.4.3 Stationary points of curvature of parametric surfaces
- 8.1.5 Fourth-order interrogation methods
- 8.1.5.1 Stationary points of torsion of space curve
- 8.1.5.2 Stationary points of total curvature
- 8.2 Stationary points of curvature of free-form parametric surfaces
- 8.2.1 Gaussian curvature
- 8.2.2 Mean curvature
- 8.2.3 Principal curvatures
- 8.3 Stationary points of curvature of explicit surfaces
- 8.4 Stationary points of curvature of implicit surfaces
- 8.5 Contouring constant curvature
- 8.5.1 Contouring levels
- 8.5.2 Finding starting points
- 8.5.3 Mathematical formulation of contouring
- 8.5.4 Examples
- 8.5.4.1 Gaussian curvature
- 8.5.4.2 Mean curvature
- 8.5.4.3 Maximum principal curvature
- 8.5.4.4 Minimum principal curvature
December 2009