Introduction to Surface Analysis
Elisabeth Shaw
Thu Jan 17, 24, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 11-Jan-2002
Participants requested to attend all sessions (non-series)
A general introduction to several useful techniques for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. Methods discussed: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM).
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 29-Oct-2001
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