X-ray Diffraction Demonstrations
Joseph A. Adario
Mon Jan 7, 01-04:00pm, 13-4027
No limit but advance sign up required (see contact below)
Signup by: 02-Jan-2002
Single session event
X-ray diffraction is a nondestructive analytical method used by materials scientists in the physical and biological sciences to characterize the structure of materials at the atomic level. A collimated beam of x-rays is directed to the material to be analyzed. The x-rays diffract into an x-ray detector forming a diffraction pattern. This pattern contains information about the types of atoms present and their locations within the crystalline lattice. The technique is empoyed with both single crystals and polycrystalline materials. Both techniques will be demonstrated. Call to reserve a demo time.
Contact: Joe Adario or Peter Kloumann, 13-4009, 36887,33691, jadario@mit.edu, phbk@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 31-Oct-2001
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