Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Tue Jan 14 thru Fri Jan 17, 09am-01:00pm, 13-1025
Enrollment limited: advance sign up required (see contact below)
Signup by: 06-Jan-2003
Limited to 6 participants.
Participants requested to attend all sessions (non-series)
A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 31-Oct-2002
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