Scanning Electron Microscopy and Microanalysis: Theory
Anthony J. Garratt-Reed
Wed Jan 22, Fri Jan 24, Wed Jan 29, Fri Jan 31, 03-04:30pm, 13-2137
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
In parallel with M. Frongillo's hands-on class, "Characterization of Materials in a High-Resolution Scanning Electron Microscope," this offering will present the essential background knowledge users require to make choices about operating conditions of the SEM, to interpret the results they obtain from the experiments, and to identify any possible artifacts or other spurious details. It will cover operating modes of the SEM; environmental SEM; X-ray analysis in the SEM; characteristics of SEM images; taking advantage of digital imaging techniques; beam damage in the SEM; image resolution; etc. Class is intended for SEM users or potential users, and assumes a basic understanding of an SEM and how it is operated.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 01-Nov-2002
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