Transmission Electron Microscopy and Microanalysis: Theory
Anthony J. Garratt-Reed
Wed Jan 8, Fri Jan 10, Wed Jan 15, Fri Jan 17, 03-04:30pm, 13-2137
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
In parallel with M. Frongillo's hands-on class, "Introduction to Transmission Electron Microscopy," this offering will present the essential background knowledge TEM users require to make choices about operating conditions, to interpret experimental results, and to identify any possible artifacts or other spurious details. Class is intended for TEM and STEM users or potential users, and assumes a basic understanding of the TEM and how it is operated.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 01-Nov-2002
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