Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Mon Jan 12 thru Fri Jan 16, 09am-01:00pm, 13-1025
Enrollment limited: advance sign up required (see contact below)
Signup by: 05-Jan-2004
Limited to 6 participants.
Participants requested to attend all sessions (non-series)
A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Energy Dispersive X-ray Microanalysis in the Electron Microscope
Dr. Anthony Garratt-Reed
Thu Jan 8, 15, 22, 29, 03-04:30pm, 13-2137, Also lab sessions TBA
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
Chemical microanalysis by energy-dispersive x-ray spectroscopy in the electron microscope is a powerful and very valuable tool for the researcher. The first lecture will start with an elementary description, with subsequent lectures exploring the topic in greater detail. Anyone interested in learning the basics is invited to attend the first lecture or two, while students looking for a deep and relatively complete understanding will want to attend the entire course. Lab sessions will be arranged according to the interests of the participants at the first lecture.
Contact: Dr. Anthony Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Introduction to Surface Analysis
Elisabeth Shaw
Tue Jan 20, 27, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 13-Jan-2004
Participants requested to attend all sessions (non-series)
A general introduction to several useful techniques for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. Methods discussed: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM).
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy (TEM)
Mike Frongillo
Mon Jan 5 thru Fri Jan 9, 09am-01:00pm, 13-1024
Enrollment limited: advance sign up required (see contact below)
Signup by: 31-Dec-2003
Limited to 4 participants.
Participants requested to attend all sessions (non-series)
The first session consists of a lecture on the basics of transmission electron microscopy and how to align and operate the instrument. The class will be assigned time slots so that each individual will be able to learn how to operate the microscope. You may bring your own samples, or samples will be provided for you. This class is intended for new users of the TEM.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Introduction to the X-ray Diffraction Laboratory
Joseph A. Adario, Peter Kloumann
Thu Jan 29, 10am-12:00pm, 13-4027
No enrollment limit, no advance sign up
Single session event
Come and learn about X-ray Diffraction and what it can do for you in your materials research. We will demonstrate single crystal techniques, methods for identifing unknown polycrystaline materials, determination of lattice constants and other uses based upon your research needs. Bring a sample for a demonstration and consult with us about applying x-ray diffraction to your material.
Contact: Joseph A. Adario, 13-4009A, x3-6887, jadario@mit.edu
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It Goes Without Saying - Crash Course in Mime
Vladimir Bulovic
Tue, Thu-Fri, Jan 6, 8-9, 13, 15-16, 20, 22-23, 12:30-02:30pm, Kresge Rehearsal RmA
Enrollment limited: advance sign up required (see contact below)
Signup by: 02-Jan-2004
Limited to 30 participants.
Participants requested to attend all sessions (non-series)
After we are done with you, you will love mimes and, even more, you will love being one! Join the class and explore expression and movement. Learn to express yourself without a single word. In eight classes we will cover the basic elements of mime. We'll give you walls, leans, ropes, and all the rest you need to be a toasted piece of bread, a cog in a Xerox machine, a fish in the sea looking for trouble. Open your eyes, use your body, and think of the space around you; your imagination will paint the rest.
Contact: Vladimir Bulovic, 13-3138, x3-7012, bulovic@mit.edu
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Magnetism and Magnetic Property Measurement: Operation of SQUID Magnetometer
Dr.Fangcheng Chou
Fri Jan 23, 10am-12:00pm, Room 13-2137
No limit but advance sign up required (see contact below)
Signup by: 21-Jan-2004
Single session event
Basics of magnetism of materials and principles of SQUID magnetometer operation will be discussed. The main theme will be how to use the SQUID magnetometer to investigate the magnetism of a wide variety of materials. Will include a demonstration.
Contact: Dr.Fangcheng Chou, 13-3134, x3-0054, fcchou@mit.edu
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Raman and FTIR Spectroscopy and Microspectroscopy at CMSE
Tim McClure
Wed Jan 28, 09am-01:00pm, Rm. 13-2137
No limit but advance sign up required (see contact below)
Signup by: 23-Jan-2004
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has Raman and FTIR spectrometer and microscopes for the use of MIT researchers. There will be presentations on the applications of Raman and FTIR analysis and the various measurement techniques available. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Thermal Analysis Capability at CMSE
Tim McClure
Tue Jan 27, 10am-12:00pm, Rm. 13-2137
No limit but advance sign up required (see contact below)
Signup by: 23-Jan-2004
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of thermal analysis equipment available for use by MIT researchers. There will be presentations on the applications and various techniques associated with thermal analysis. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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