Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Mon Jan 10 thru Fri Jan 14, 09am-01:00pm, 13-1025
Enrollment limited: advance sign up required (see contact below)
Signup by: 05-Jan-2005
Limited to 6 participants.
Participants requested to attend all sessions (non-series)
A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Digital Imaging and Image Analysis
Dr. Anthony J. Garratt-Reed
No enrollment limit, no advance sign up
Participants welcome at individual sessions (series)
Descriptions of the the basics of digital image acquisition, storage, presentation and analysis. Discussion of the consequences for the scientific researcher. Examples of free/shareware image analysis software will be demonstrated. Participants are invited to bring their own images for discussion in session 4. Attendance at all 4 sessions is recommended.
Contact: Dr. Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
Digital images, image formats, image acquisition hardware and issues, image storage
Dr. Anthony J. Garratt-Reed
Thu Jan 6, 03-04:30pm, 13-2137
Image presentation and reproduction, printers, CRT and projection displays
Dr. Anthony J. Garratt-Reed
Thu Jan 13, 03-04:30pm, 13-2137
Image enhancement, image analysis
Dr. Anthony J. Garratt-Reed
Thu Jan 20, 03-04:30pm, 13-2137
Examples, discussion, etc
Dr. Anthony J. Garratt-Reed
Thu Jan 27, 03-04:30pm, 13-2137
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Introduction to Surface Analysis
Elisabeth Shaw
Wed Jan 19, 26, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 14-Jan-2005
Participants requested to attend all sessions (non-series)
A general introduction to several useful techniques for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. Methods discussed: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM).
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy (TEM)
Mike Frongillo
Mon Jan 3 thru Fri Jan 7, 09am-01:00pm, 13-1024
Enrollment limited: advance sign up required (see contact below)
Signup by: 29-Dec-2004
Limited to 4 participants.
Participants requested to attend all sessions (non-series)
The first session consists of a lecture on the basics of transmission electron microscopy and how to align and operate the instrument. The class will be assigned time slots so that each individual will be able to learn how to operate the microscope. You may bring your own samples, or samples will be provided for you. This class is intended for new users of the TEM.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Introduction to the Bruker Microdiffractometer
Joseph Adario, Peter Kloumann
Wed Jan 19, 10am-01:00pm, 13-4027
No enrollment limit, no advance sign up
Single session event
The Bruker D-8 microdiffractometer is the latest addition to the X-ray Diffraction Facility. With its large area detector, a wide range of peaks can be measured in as little as 5-10 seconds. In the point measurement mode, it is capable of analyzing areas from 50-500 microns. Larger areas may be analyzed by scanning the sample under the x-ray beam while collecting data. The quarter circle Eularian Goniometer allows positioning the sample from 90-0 degrees in chi and from 0-360 degrees in Phi. Sample alignment is done with a laser and CCD camera. Attachments are available for high temperature (900C) and texture measurements and there is a vacuum chuck which will accommodate 5" wafers. We invite you to bring a sample for demonstration.
Contact: Joseph Adario, 13-4009A, x3-6887, jadario@mit.edu
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Introduction to the X-ray Diffraction Laboratory
Joseph A. Adario, Peter Kloumann
Wed Jan 26, 10am-01:00pm, 13-4027
No enrollment limit, no advance sign up
Single session event
Come and learn about x-ray diffraction and what it can do for you in your materials research. We will demonstrate single crystal techniques, methods for identifing unknown polycrystaline materials, determination of lattice constants and other uses based upon your research needs. Bring a sample for a demonstration and consult with us about applying x-ray diffraction to your material.
Contact: Joseph A. Adario, 13-4009A, x3-6887, jadario@mit.edu
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Magnetism and Magnetic Property Measurement: Operation of SQUID Magnetometer
Dr.Fangcheng Chou
Fri Jan 28, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 21-Jan-2005
Single session event
Basics of magnetism of materials and principles of SQUID magnetometer operation will be discussed. The main theme will be how to use the SQUID magnetometer to investigate the magnetism of a wide variety of materials. Will include a demonstration.
Contact: Dr.Fangcheng Chou, 13-3134, x3-0054, fcchou@mit.edu
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Raman and FTIR Spectroscopy and Microspectroscopy at CMSE
Tim McClure
Tue Jan 18, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 14-Jan-2005
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has Raman and FTIR spectrometers and microscopes for the use of MIT researchers. There will be presentations on the applications of Raman and FTIR analysis and the various measurement techniques available. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Thermal Analysis Capability at CMSE
Tim McClure
Tue Jan 25, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 24-Jan-2005
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of thermal analysis equipment available for use by MIT researchers. There will be presentations on the applications and various techniques associated with thermal analysis. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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