Electron Microprobe Analysis on the JEOL JXA-733 Superprobe
Fri Jan 7, 01-03:00pm, 54-1221
No enrollment limit, no advance sign up
Single session event
In this session you will have hands-on experience on our JEOL-733 electron microprobe with enhanced imaging capabilities and learn about wavelength and energy dispersive spectrometry, backscattered electron, secondary electron, cathodoluminescence, and elemental x-ray imaging.
Contact: Nilanjan Chatterjee, 54-1216, x3-1995, firstname.lastname@example.org
Sponsor: Earth, Atmospheric and Planetary Sciences
Latest update: 27-Oct-2004