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IAP 2005 Activity


Introduction to the Bruker Microdiffractometer
Joseph Adario, Peter Kloumann
Wed Jan 19, 10am-01:00pm, 13-4027

No enrollment limit, no advance sign up
Single session event

The Bruker D-8 microdiffractometer is the latest addition to the X-ray Diffraction Facility. With its large area detector, a wide range of peaks can be measured in as little as 5-10 seconds. In the point measurement mode, it is capable of analyzing areas from 50-500 microns. Larger areas may be analyzed by scanning the sample under the x-ray beam while collecting data. The quarter circle Eularian Goniometer allows positioning the sample from 90-0 degrees in chi and from 0-360 degrees in Phi. Sample alignment is done with a laser and CCD camera. Attachments are available for high temperature (900C) and texture measurements and there is a vacuum chuck which will accommodate 5" wafers. We invite you to bring a sample for demonstration.
Contact: Joseph Adario, 13-4009A, x3-6887, jadario@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 22-Nov-2004


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Last update: 30 September 2004