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Physics Lectures for the General MIT Community: g Scanning Tunneling Microscopy: A Tool for Atomic Scale Measurement
Prof. Eric Hudson
Wed Jan 26, 01:30-02:30pm, 6-120
No enrollment limit, no advance sign up
Single session event
As technology drives electronics towards "nanoelectronics," where wires are a few atoms wide and transistors are sensitive to single electrons, physicists must have a tool to investigate the new phenomena that arise in this regime. The Scanning Tunneling Microscope is one such tool, and in this talk I will highlight its ability to image and move atoms, and discuss some results of my research on high temperature superconductors.
Contact: Prof. Eric Hudson, 13-2114, 452-2115, ehudson@mit.edu
Sponsor: Physics
Latest update: 25-Jan-2005
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