Introduction to Surface Analysis
Elisabeth Shaw
Wed Jan 18, 25, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 16-Jan-2006
Participants requested to attend all sessions (non-series)
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. This course is a general introduction to three of these techniques: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to the X-ray Diffraction Laboratory
Peter Kloumann
Wed Jan 18, 10am-01:00pm, 13-4027
No enrollment limit, no advance sign up
Single session event
Learn about x-ray diffraction and what it can do for you. We will introduce both a Rigaku and a Bruker generator, and demonstrate methods for identifying unknown polycrystalline materials, determination of lattice constants and other uses based upon your research needs. The Rigaku has a high resolution 250 mm diffractometer and a high intensity 185 mm diffractometer. The Bruker D8 microdiffractometer has a large area detector. The quarter circle Eularian goniometer allows positioning the sample accurately in any orientation. Accessories are available for high temperature (900C) investigation. Bring a sample for a demonstration and consult with us about applying X-ray diffraction methods to your material.
Contact: Peter Kloumann, 13-4009B, x3-3691, phbk@mit.edu
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Make Your Data More Accurate When Using a SQUID Magnetometer
Dr. Shaoyan Chu
Tue Jan 24, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 17-Jan-2006
Single session event
Basic principles of the SQUID magnetometer and its operation will be discussed. The main theme focusses on more actual measurement for a wide variety of materials. Skill building will include loading and centering samples under measurement parameters. You are welcome to bring your questions and samples.
Contact: Dr. Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu
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Spectroscopic Instrumentation at CMSE
Tim McClure
Wed Jan 25, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 23-Jan-2006
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of spectroscopic instrumentation available for the use of MIT researchers. These include FTIR, Raman, UV/VIS and fluorimeter. There will be presentations on the instrumentation and the various measurement techniques available. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Thermal Analysis Capability at CMSE
Tim McClure
Wed Jan 18, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 16-Jan-2006
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of thermal analysis equipment available for use by MIT researchers. There will be presentations on the instrumentation and various techniques associated with thermal analysis. Preregister via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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