Introduction to Surface Analysis
Elisabeth Shaw
Wed Jan 18, 25, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 16-Jan-2006
Participants requested to attend all sessions (non-series)
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. This course is a general introduction to three of these techniques: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 08-Nov-2005
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