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IAP 2007 Activities by Sponsor

Center for Materials Science and Engineering

Intro. to the Theory of Transmission Electron Microscopy of Materials
Anthony J. Garratt-Reed, Silvija Gradecak, Vahik Krikorian
No enrollment limit, no advance sign up
Participants welcome at individual sessions (series)
Prereq: Knowledge of TEM as a basic user

This activity is a lecture series presenting the basic theory of electron microscopy of materials. Participants are expected to have used a TEM, but no other theoretical knowledge will be assumed. Participants are welcome at individual sessions, but each presentation will assume familiarity of material presented in earlier sessions.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu

The Hardware
Dr. Garratt-Reed
A description of the hardware of the typical transmission electron microscope, from the electron source to the final image. The presentation will include a discussion of the imperfections (aberrations) in the imaging system, and how these limit the final result.
Tue Jan 16, 03-04:30pm, 13-2137

Image formation - I
Professor Gradecak
The first part of a two-session discussion of image formation in the TEM. This will include a description of image contrast mechanisms, resolution limits and specimen requirements for optimum image quality and maximum information content. It will also include a discussion of techniques, including image simulation, for extracting from the image quantitative information about the structure of the sample.
Fri Jan 19, 03-04:30pm, 13-2137

Image formation - II
Professor Gradecak
A continuation of the presentation of January 19th. This session is not recommended for participants who did not attend part I.
Mon Jan 22, 03-04:30pm, 13-2137

Energy-Dispersive X-ray Analysis in the TEM and STEM
Dr. Garratt-Reed
A very important application of transmission electron microscopy and scanning transmission electron microscopy is microanalysis of the sample on a very fine scale by using spectroscopy of the x-rays emitted by the sample during electron bombardment. This session will examine the technique in detail, including the results that might be expected, and considerations that must be borne in mind when planning an experiment.
Tue Jan 23, 03-04:30pm, 13-2137

Electron Energy-Loss Spectroscopy in the TEM
Dr. Krikorian
Electron Energy-Loss Spectroscopy (EELS) is another very important analytical tool for the electron microscopist, not only providing chemical analysis, but giving information on the electronic structure (bonding) of the atoms almost at the atomic scale. This presentation will explore what can be done, illustrating why EELS is such an important tool despite its complexities
Mon Jan 29, 03-04:30pm, 13-2137

Other techniques in the TEM
Professor Gradecak
The TEM is a very versatile instrument. This session will present an introduction to other methods that can be used to provide information about solid samples, including selected-area and convergent-beam electron diffraction, and cathodoluminescence.
Tue Jan 30, 03-04:30pm, 13-2137

Introduction to Scanning Electron Microscopy
Patrick Boisvert
Thu Jan 25, 10-11:00am, 13-2137

No enrollment limit, no advance sign up
Single session event

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu

Introduction to Surface Analysis
Libby Shaw
Wed Jan 17, 24, 02-05:00pm

No limit but advance sign up required (see contact below)
Signup by: 12-Jan-2007
Participants welcome at individual sessions (series)
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. This course is a general introduction to three of these techniques: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu

Introduction to Transmission Electron Microscopy
Yong Zhang
Fri Jan 26, 02-04:00pm, 13-2137

No enrollment limit, no advance sign up
Single session event

The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu

Introduction to the CMSE Shared Experimental Facilities
Anthony J. Garratt-Reed, SEF Staff
Thu Jan 11, 02-05:00pm, 13-2137, Refreshments provided

No enrollment limit, no advance sign up
Single session event

The Shared Experimental Facilities in the Center for Materials Science and Engineering provide a wide range of Materials Characterization instrumentation openly available to researchers. This includes electron microscopes, X-ray diffraction systems, surface analysis, spectroscopy techniques, thermal analysis and crystal growth furnaces. Come and find out more details about what we have, what it can do for you, and who runs it! Each staff member will give a short introduction to the instruments in their care. Most staff will be offering a more detailed presentation about their equipment later during IAP.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu

Make Your Data More Accurate When Using a SQUID Magnetometer
Dr. Shaoyan Chu
Mon Jan 22, 10-11:00am, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 17-Jan-2007
Single session event

Basic principles of the SQUID magnetometer and its operation will be discussed. The main theme focusses on more actual measurement for a wide variety of materials. Skill building will include loading and centering samples under measurement parameters. You are welcome to bring your questions, data and samples.
Contact: Dr. Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu

Nanocrystallite Size Analysis Using XRD
Scott A Speakman
Thu Jan 18, 02-04:00pm, 13-2137

Enrollment limited: first come, first served
Limited to 25 participants.
Single session event

X-ray diffraction data can be used to estimate the crystallite size of nanophase materials. However, this analysis is often done incorrectly and with disregard for the limitations of current techniques. This lecture will review the common techniques used for nanocrystallite size analysis, such as the Scherrer, Hall-Williamson, and Warren-Averbach methods, with particular attention to their strengths, weaknesses, and underlying assumptions. The software and capabilities available in the X-ray SEF will be reviewed, as well as complementary techniques available at the CMSE and elsewhere. Discussion will then expand to new methods under development and ways that MIT might contribute to their maturation.
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu

Spectroscopic Instrumentation at CMSE
Tim McClure MIT
Wed Jan 31, 10am-12:00pm, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 29-Jan-2007
Single session event

The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of Spectroscopic instrumentation available for the use of MIT researchers. These include FTIR, Raman, UV/VIS and Fluorimeter. There will be presentations on the instrumentation and the various measurement techniques available.
Contact: Tim McClure, 13-4149, (617) 258-6470, mtim@mit.edu

The Wonders of X-Ray Diffraction
Scott A Speakman
Thu Jan 25, 02-04:00pm, 13-2137

Enrollment limited: first come, first served
Limited to 40 participants.
Single session event

X-ray diffraction is a versatile technique for measuring a number of characteristics of crystalline and semi-crystalline materials. This seminar will survey the information that might be learned from polycrystalline materials using XRD. Rather than discussing theory, examples will be used to illustrate the use of XRD to measure: quantitative phase composition, crystallite size, microstrain, residual stress, texture, rate constants and activation energies for reactions, crystallinity, etc. The capabilities and limitations of the instruments in the CMSE X-Ray SEF will also be discussed.

This lecture is designed to help those unfamiliar with X-ray diffraction decide if XRD could be useful for their research. Researchers using XRD for basic phase ID may also find benefit in exploring the more advanced analyses that are possible.
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu


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Last update: 30 September 2004