Electron Microprobe Analysis on the JEOL JXA-733 Superprobe
Nilanjan Chatterjee
Fri Jan 12, 01-03:00pm, 54-1221
No enrollment limit, no advance sign up
Single session event
In this session you will have hands-on experience on our JEOL-733 electron microprobe with enhanced imaging capabilities. You'll learn about wavelength and energy dispersive spectrometry, backscattered electron, secondary electron, cathodoluminescence, and elemental x-ray imaging.
Web: http://web.mit.edu/e-probe/www/iap.html
Contact: Nilanjan Chatterjee, 54-1216, x3-1995, nchat@mit.edu
Sponsor: Earth, Atmospheric and Planetary Sciences
Latest update: 07-Nov-2006
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