Nanocrystallite Size Analysis Using XRD
Scott A Speakman
Thu Jan 18, 02-04:00pm, 13-2137
Enrollment limited: first come, first served
Limited to 25 participants.
Single session event
X-ray diffraction data can be used to estimate the crystallite size of nanophase materials. However, this analysis is often done incorrectly and with disregard for the limitations of current techniques. This lecture will review the common techniques used for nanocrystallite size analysis, such as the Scherrer, Hall-Williamson, and Warren-Averbach methods, with particular attention to their strengths, weaknesses, and underlying assumptions. The software and capabilities available in the X-ray SEF will be reviewed, as well as complementary techniques available at the CMSE and elsewhere. Discussion will then expand to new methods under development and ways that MIT might contribute to their maturation.
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 17-Nov-2006
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