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IAP 2007 Activity


Intro. to the Theory of Transmission Electron Microscopy of Materials
Anthony J. Garratt-Reed, Silvija Gradecak, Vahik Krikorian
No enrollment limit, no advance sign up
Participants welcome at individual sessions (series)
Prereq: Knowledge of TEM as a basic user

This activity is a lecture series presenting the basic theory of electron microscopy of materials. Participants are expected to have used a TEM, but no other theoretical knowledge will be assumed. Participants are welcome at individual sessions, but each presentation will assume familiarity of material presented in earlier sessions.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
Sponsor: Center for Materials Science and Engineering

The Hardware
Dr. Garratt-Reed
A description of the hardware of the typical transmission electron microscope, from the electron source to the final image. The presentation will include a discussion of the imperfections (aberrations) in the imaging system, and how these limit the final result.
Tue Jan 16, 03-04:30pm, 13-2137

Image formation - I
Professor Gradecak
The first part of a two-session discussion of image formation in the TEM. This will include a description of image contrast mechanisms, resolution limits and specimen requirements for optimum image quality and maximum information content. It will also include a discussion of techniques, including image simulation, for extracting from the image quantitative information about the structure of the sample.
Fri Jan 19, 03-04:30pm, 13-2137

Image formation - II
Professor Gradecak
A continuation of the presentation of January 19th. This session is not recommended for participants who did not attend part I.
Mon Jan 22, 03-04:30pm, 13-2137

Energy-Dispersive X-ray Analysis in the TEM and STEM
Dr. Garratt-Reed
A very important application of transmission electron microscopy and scanning transmission electron microscopy is microanalysis of the sample on a very fine scale by using spectroscopy of the x-rays emitted by the sample during electron bombardment. This session will examine the technique in detail, including the results that might be expected, and considerations that must be borne in mind when planning an experiment.
Tue Jan 23, 03-04:30pm, 13-2137

Electron Energy-Loss Spectroscopy in the TEM
Dr. Krikorian
Electron Energy-Loss Spectroscopy (EELS) is another very important analytical tool for the electron microscopist, not only providing chemical analysis, but giving information on the electronic structure (bonding) of the atoms almost at the atomic scale. This presentation will explore what can be done, illustrating why EELS is such an important tool despite its complexities
Mon Jan 29, 03-04:30pm, 13-2137

Other techniques in the TEM
Professor Gradecak
The TEM is a very versatile instrument. This session will present an introduction to other methods that can be used to provide information about solid samples, including selected-area and convergent-beam electron diffraction, and cathodoluminescence.
Tue Jan 30, 03-04:30pm, 13-2137
Latest update: 27-Nov-2006


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Last update: 30 September 2004