Energy-Dispersive X-ray Analysis in the TEM (A) - Theory
Anthony J. Garratt-Reed, Neil Rowlands
Tue Jan 22, 03-04:30pm, 13-2137
Single session event
In the form of a lecture, this activity will take a look at the theory and practice of EDX analysis in the TEM, how it works, and its limits in terms of sensitivity and resolution. It is intended for graduate students and other researchers who are using, or will need to use, this type of analysis for their research. A practical session will follow (separate activity listing).
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Energy-Dispersive X-ray Analysis in the TEM (B) - Practical
Anthony J. Garratt-Reed, Neil Rowlands
Thu Jan 24, 02-05:00pm, 24-041K
Enrollment limited: advance sign up required (see contact below)
Limited to 10 participants.
Single session event
Prereq: Attended theory lecture on 1/22
A practical demonstration of the use of the JEOL 2010F TEM and the Oxford INCA EDX system to perform x-ray microanalysis. The demonstrator will be Dr. Neil Rowlands, EDX Product Manager for Oxford Instruments Microanalysis Group. This activity is a follow-on of the theoretical lecture given by Dr. Garratt-Reed on 1/22, and is intended for researchers who are or soon will be using the microscope for their work. Talk to Dr. Garratt-Reed if you would like to bring your own sample for the demonstration.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Introduction to Scanning Electron Microscopy
Patrick Boisvert
Thu Jan 24, 10-11:00am, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu
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Introduction to Surface Analysis
Libby Shaw
Wed Jan 23, 30, 02-05:00pm, Room 13-2137
No limit but advance sign up required (see contact below)
Signup by: 19-Jan-2008
Participants welcome at individual sessions (series)
Prereq: none
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. This two-session course is a general introduction to three of these techniques: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy
Yong Zhang
Fri Jan 25, 02-03:30pm, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu
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Introduction to the CMSE Shared Experimental Facilities
Anthony J. Garratt-Reed, SEF Staff
Thu Jan 10, 02-05:00pm, 13-2137, Refreshments Provided
No enrollment limit, no advance sign up
Single session event
The Shared Experimental Facilities in the Center for Materials Science and Engineering provide a wide range of Materials Characterization instrumentation openly available to researchers. This includes electron microscopes, X-ray diffraction systems, surface analysis, spectroscopy techniques, thermal analysis and crystal growth furnaces. Come and find out more details about what we have, what it can do for you, and who runs it! Each staff member will give a short introduction to the instruments in their care. Most staff will be offering a more detailed presentation about their equipment later during IAP.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Make Your Data More Accurate from AC Measureent in a SQUID Magnetometer
Dr. Shaoyan Chu
Wed Jan 30, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 23-Jan-2008
Single session event
Basic principles of measurement on AC susceptibility in a SQUID magnetometer will be presented. The main theme focuses on instrument operation and sample preparation for a wide variety of materials. Skill building will include loading and centering samples under AC measurement parameters. You are welcome to bring your questions, data and samples.
Contact: Dr. Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu
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Nanocrystallite Size Analysis Using XRD
Scott A Speakman
Thu Jan 24, 02-05:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
X-ray diffraction can be used to estimate the crystallite size, microstrain, and defect density of nanophase materials. The method is powerful, but prone to error when certain assumptions and limitations are not acknowledged. This lecture will review the common techniques used for nanocrystallite size and microstrain analysis, such as the Scherrer, Hall-Williamson, and Rietveld methods. The lecture will demonstrate how these techniques can be easily and correctly used in the X-ray SEF of the CMSE.
Last year’s lecture focused on the underlying theory of this analysis technique. This year’s lecture has been revised, based on feedback, to focus more on practical application. Attendees should leave this lecture with a firm understanding of the steps required to correctly collect data and begin their crystallite size analysis.
Web: http://prism.mit.edu/xray
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu
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Spectroscopic Instrumentation at CMSE
Tim McClure MIT
Thu Jan 31, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 29-Jan-2008
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of Spectroscopic instrumentation available for the use of MIT researchers. These include UV/VIS/NIR, FTIR and Raman. There will be presentations on the instrumentation and the various measurement techniques available.
Contact: Tim McClure, 13-4149, (617) 258-6470, mtim@mit.edu
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The Wonders of X-Ray Diffraction
Scott A Speakman
Thu Jan 17, 02-05:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
X-ray diffraction is a versatile technique for measuring a number of characteristics of crystalline and semi-crystalline materials. This seminar will survey the information that might be learned from polycrystalline materials using XRD. Rather than discussing theory, examples will be used to illustrate the use of XRD to measure: quantitative phase composition, crystallite size, microstrain, residual stress, texture, rate constants and activation energies for reactions, crystallinity, etc. The capabilities and limitations of the instruments in the CMSE X-Ray SEF will also be discussed.
This lecture is designed to help those unfamiliar with X-ray diffraction decide if XRD could be useful for their research. Researchers using XRD for basic phase ID may also find benefit in exploring the more advanced analyses that are possible.
Web: http://prism.mit.edu/xray
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu
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Thermal Analysis Capabilities at CMSE
Tim McClure
Wed Jan 23, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 22-Jan-2008
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of Thermal Analysis instrumentation available for the use of MIT researchers. These include Differential Scanning Calorimeter (DSC), ThermoGravimetric Analyzer (TGA) Differential Thermal Analyzer (DTA) and Dynamic Mechanical Analyzer (DMA). There will be presentations on the instrumentation and the various measurement techniques available.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Thin Film Analysis Using X-rays
Scott A Speakman
Thu Jan 31, 02-05:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
X-rays can be used in many ways to analyze thin films. In February, a new high-resolution X-ray diffractometer will arrive in the X-ray SEF that will greatly enhance our ability to analyze thin films. This lecture will survey several techniques, including grazing-incidence X-ray diffraction, rocking curves, reciprocal space maps, and X-ray reflectivity. We will discuss how the X-ray SEF can help you determine the phase composition, depth profile, density, roughness, thickness, compositional gradient, stress and relaxation, defect density, and texture/epitaxy of your thin film material.
Attendees will not learn the intricacies required to apply these techniques, but rather will leave the lecture with an understanding of the potential power and limitations that XRD might offer their thin film research.
Web: http://prism.mit.edu/xray
Contact: Scott A Speakman, 13-4009A, x3-6887, speakman@mit.edu
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