An Introduction to Inductively Coupled Plasma Atomic Emission Spectrometry
Dr. Shaoyan Chu
Fri Jan 23, 01-02:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 15-Jan-2009
Single session event
Topics covered include the concept of ICP-AES spectrometry and the process of basic sample preparation, calibration and background correction.
Contact: Dr. Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu
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Introduction to Electrical Characterization Using AFM
Peter De Wolf, PhD, Application Director, Veeco Metrology
Wed Jan 28, Thu Jan 29, 09am-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 26-Jan-2009
Single session event
Prereq: Familiarity with Atomic Force Microscopy recommended
This two-day workshop is an introduction to a variety of scanned probe microscopies for characterizing electrical properties of materials on the nanoscale, such as Scanning Capacitance, Scanning Conductance, and Tunneling AFM, and a new AFM imaging mode called Torsional Resonance. The workshop will include a day and a half in the laboratory, using CMSE's new Veeco Metrology Nanoscope 5 Scanned Probe Microscope to analyze materials provided by course participants. Cosponsored by Veeco Metrology. Please contact Libby Shaw if you have a sample you'd like to take a look at during this workshop.
Contact: Libby Shaw, 13-4149, 253-5045, elshaw@mit.edu
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Introduction to Scanning Electron Microscopy
Patrick Boisvert
Thu Jan 22, 10-11:00am, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu
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Introduction to Surface Analysis Part 1: Auger Electron Spectroscopy and XPS
Libby Shaw
Thu Jan 15, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 09-Jan-2009
Single session event
Prereq: none
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Thursday, January 22).
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Surface Analysis Part 2: Scanned Probe Microscopies
Libby Shaw
Thu Jan 22, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 09-Jan-2009
Single session event
CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers. This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces. With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Electrical Characterization using AFM" on January 28-29.
Contact: Libby Shaw, 13-4149, 253-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy
Yong Zhang
Fri Jan 23, 02-03:30pm, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu
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Rietveld Analysis of X-Ray Diffraction Data Workshop
Scott Speakman
Tue Jan 13, Wed Jan 14, Thu Jan 15, 01-05:00pm, 13-4041
Enrollment limited: advance sign up required (see contact below)
Signup by: 09-Jan-2009
Limited to 8 participants.
Participants requested to attend all sessions (non-series)
Prereq: understanding of diffraction and XRD data collection
This workshop will teach students how to use the Rietveld method, as implemented in the software package PANalytical HighScore Plus, to analyze X-ray diffraction data.
The 3-day workshop will be broken up as follows:
Tuesday, Jan 13: introduce the Rietveld method; learn the software interface; simulate XRD patterns from a crystal structure; refine a simple crystal structure.
Wed, Jan 14: advanced applications: determine the average size of nanocrystalline materials; quantitative phase analysis of a mixture; refine site occupancy of a doped material.
Thurs, Jan 15: more advanced topics: refine data provided by students; explore topics of interest chosen by the students.
Students will be expected to attend both the Tuesday and Wednesday sessions. Attendance of the Thursday session is optional.
Web: http://prism.mit.edu/xray
Contact: Scott Speakman, 13-4009A, x3-6887, speakman@mit.edu
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The Use of Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) to Characterize Materials and Quantify Events Occurring at Surfaces
Timothy McClure, Stephen Hussey, of Q-Sense, Inc.
Tue Jan 27, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 26-Jan-2009
Single session event
The Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) is a nanomechanical, acoustic-based analytical technique that provides in situ analysis of interactions and reactions taking place at surfaces. In addition to revealing molecular mass, the dissipation parameter (D) provides novel insights regarding structural (viscoelastic) properties of many surface substrates before, during and after the interaction. The CMSE Analysis Shared Experimental Facility recently purchased a QCM-D and has made it available to the research community Come find out how the QCM-D can benefit your research.
Contact: Timothy McClure, 13-4149, x8-6470, mtim@mit.edu
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Vibrational Spectroscopic Instrumentation at CMSE
Tim McClure MIT
Thu Jan 29, 10am-02:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 28-Jan-2009
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of vibrational spectroscopic instrumentation that is available for the use of researchers. These include FTIR, Raman and UV/VIS/NIR. Come find out how these instruments are used and how they can benefit your research.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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