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IAP 2010 Activity


Adventures in Scanning Electron Microscopy
Donald Galler
Tue Jan 12, Thu Jan 14, 09am-05:00pm, 4-141, 1 hour lunch break

Enrollment limited: advance sign up required (see contact below)
Signup by: 01-Jan-2010
Limited to 20 participants.
Repeating event. Participants welcome at any session
Prereq: Attendees must be present for the entire day.

The seminar is an introduction to the basic operation of a scanning electron microscope. The basic operating principles will be covered and the attendees will be trained on the use of the microscope. This is a modern scanning electron microscope with several advanced features: low pressure chamber, computer controlled positioning stage. The SEM is equipped with an energy dispersive spectroscopy system for elemental analysis. Attendees will also be familiarized with the operation and capabilities of the EDS system. Attendees are encouraged to bring samples for exploration.

Note: 10 attendees per session.
Contact: Donald Galler, 4-133, x3-4554, dgaller@mit.edu
Sponsor: Materials Science and Engineering
Latest update: 23-Oct-2009


MIT  
Massachusetts Institute of Technology
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Comments and questions to: iap-www@mit.edu Academic Resource Center, Room 7-104, 617-253-1668
Last update: 19 August 2010