Introduction to Transmission Electron Microscopy
Yong Zhang
Thu Jan 21, 02-03:30pm, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 06-Nov-2009
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