An Introduction to Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
Dr. Shaoyan Chu
Thu Jan 6, 02-03:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 03-Jan-2011
Single session event
Topics of this training course include the concept of ICP-AES and processes of basic sample preparation, calibration and background correction.
Contact: Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu
|
FT-IR Microspectroscopy at CMSE
Tim McClure
Mon Jan 24, 10am-01:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 22-Jan-2011
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has recently acquired a new FT-IR Microscope that is available for the use of researchers. Come find out how this instruments is used and how it can benefit your research.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
|
Introduction to Scanning Electron and Focused Ion Beam Microscopy, Part 1: SEM
Patrick Boisvert, Shiahn Chen
Thu Jan 27, 02-03:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu
|
Introduction to Scanning Electron and Focused Ion Beam Microscopy, Part 2: Focused Ion Beam (FIB)
Shiahn Chen, Patrick Boisvert
Thu Jan 27, 03:30-05:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
This lecture will cover the basic principles of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarity to, the electron-beam instrument. In addition, the lecture will describe the configuration of the new FEI Helios 600 Nanolab Dual Beam workstation in the CMSE Electron Microscopy Facility, and conclude with application examples as well as open discussion of the material characterization and nanofabrication uses of the dual-beam workstation.
Contact: Shiahn Chen, 13-1027, 253-4622, schen3j@mit.edu
|
Introduction to Surface Analysis Part 1: Auger Electron Spectroscopy and XPS
Libby Shaw
Wed Jan 19, 02-05:00pm, Room 13-2137
No limit but advance sign up required (see contact below)
Signup by: 14-Jan-2011
Single session event
Prereq: none
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Wednesday, January 26).
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu
|
Introduction to Surface Analysis Part 2: Scanned Probe Microscopies
Libby Shaw
Wed Jan 26, 02-05:00pm, Room 13-2137
No limit but advance sign up required (see contact below)
Signup by: 21-Jan-2011
Single session event
CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers. This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces. With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 1" on January 19.
Contact: Libby Shaw, 13-4149, 253-5045, elshaw@mit.edu
|
Introduction to Transmission Electron Microscopy
Yong Zhang
Thu Jan 20, 02-03:30pm, 13-2137
No enrollment limit, no advance sign up
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu
|
Is There Life After Being a Materials Postdoc at MIT?
Michael F. Rubner
Mon Jan 24, 03-06:00pm, Room 34-401
Enrollment limited: advance sign up required (see contact below)
Signup by: 19-Jan-2011
Limited to 60 participants.
Single session event
Are you looking forward to a career in materials research and/or academia? Thinking about next steps? Concerned about juggling your family and professional lives? You’re not the first! Get advice from faculty and researchers in the field of materials science and engineering who have been in your shoes. A panel will describe their career paths and offer advice on strategies for successfully reaching your professional aspirations. Come join the discussion, ask questions and stay for a social hour with refreshments
Contact: Susan Rosevear, 13-2082, x3-0916, susang@mit.edu
Cosponsor: Materials Science and Engineering
|
|
