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IAP 2012 Activities by Sponsor

Center for Materials Science and Engineering

An Introduction to Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
Dr. Shaoyan Chu
Thu Jan 26, 01-02:00pm, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 19-Jan-2012
Single session event

Topics of this training course include the concept of ICP-AES and processes of basic sample preparation, calibration and background correction.
Contact: Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu

FT-IR Microspectroscopy at CMSE
Tim McClure
Mon Jan 23, 10am-01:00pm, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 22-Jan-2012
Single session event

The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an FT-IR microscope that is available for the use of researchers. Come find out how this instruments is used and how it can benefit your research.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu

Introduction to Scanning Electron and Focused Ion Beam Microscopy, Part 1: SEM
Patrick Boisvert, Shiahn Chen
Thu Jan 26, 02-03:00pm, 13-2137

No enrollment limit, no advance sign up
Single session event

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu

Introduction to Scanning Electron and Focused Ion Beam Microscopy: Part 2. Focused Ion Beam (FIB)
Shiahn Chen, Patrick Boisvert
Thu Jan 26, 03-04:30pm, 13-2137

No enrollment limit, no advance sign up
Single session event

This lecture will cover the basic elements of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarity to, the electron-beam instrument. In addition, the lecture will describe the configuration of the FEI Helios 600 Nanolab Dual Beam workstation in the CMSE Electron Microscopy Facility, and conclude with application examples as well as an open discussion of the material characterization and nanofabrication uses of the dual-beam workstation.
Contact: Shiahn Chen, 13-1027, x3-4622, schen3j@mit.edu

Introduction to Surface Analysis Part 1: Auger Electron Spectroscopy and XPS
Libby Shaw
Wed Jan 18, 02-05:00pm, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 13-Jan-2012
Single session event
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Wednesday, January 25).
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu

Introduction to Surface Analysis Part 2: Scanned Probe Microscopies
Libby Shaw
Wed Jan 25, 02-05:00pm, 13-2137

No limit but advance sign up required (see contact below)
Signup by: 20-Jan-2012
Single session event

CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers. This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces. With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 1" on January 18.
Contact: Libby Shaw, 13-4149, 253-5045, elshaw@mit.edu

Introduction to Transmission Electron Microscopy
Yong Zhang
Tue Jan 24, 02-03:30pm, 13-2137

No enrollment limit, no advance sign up
Single session event

The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be presented with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, x3-5092, yzhang05@mit.edu


MIT  
Massachusetts Institute of Technology
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Last update: 7 Sept. 2011