Introduction to Surface Analysis Part 1: Auger Electron Spectroscopy and XPS
Libby Shaw
Wed Jan 18, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 13-Jan-2012
Single session event
Prereq: none
CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Wednesday, January 25).
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 01-Nov-2011
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