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IAP 2012 Activity
Introduction to Scanning Electron and Focused Ion Beam Microscopy, Part 1: SEM
Patrick Boisvert, Shiahn Chen
Thu Jan 26, 02-03:00pm, 13-2137
No enrollment limit, no advance sign up
Single session event
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 27-Dec-2011
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