Introduction to Surface Analysis Part 2: Scanned Probe Microscopies
Libby Shaw
Wed Jan 25, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 20-Jan-2012
Single session event
CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers. This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces. With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 1" on January 18.
Contact: Libby Shaw, 13-4149, 253-5045, elshaw@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 01-Nov-2011
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