Libby Shaw
| Jan/22 | Tue | 02:00PM-05:00PM | Room 13-5002 |
Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/18
CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers. This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces. With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 1 on January 15.
Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 2535045, elshaw@mit.edu