Patrick Boisvert, Technical Associate
Jan/30 | Thu | 01:00PM-03:00PM | 13-2137 |
Enrollment: Unlimited: No advance sign-up
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu