MIT: Independent Activities Period: IAP

IAP 2014



Introduction to Scanning Electron Microscopy

Patrick Boisvert, Technical Associate

Jan/30 Thu 01:00PM-03:00PM 13-2137

Enrollment: Unlimited: No advance sign-up

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.

Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu