Charles Settens, Research Specialist - CMSE XRD SEF
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Jan/12 | Mon | 10:00AM-04:00PM | 13-4041, Lunch break from 12pm-1pm |
Enrollment: Limited: Advance sign-up required
Sign-up by 01/07
Limited to 10 participants
This workshop will introduce set of general guidelines for structure refinement using the Rietveld (whole-profile) method. The practical rather than the theoretical aspects of each step in a typical Rietveld refinement are discussed with a view to guiding newcomers in the field. The topics covered include (1) data collection, (2) background contribution, (3) peak-shape function, (4) refinement of profile parameters, (5) Fourier analysis with powder diffraction data, (6) refinement of structural parameters, (7) use of geometric restraints, (8) calculation of estimated standard deviations (ESD's), (9) interpretation of R values and (10) some common problems and possible solutions.
Contact: Charles Settens, 13-4009A, 845-430-2584, SETTENS@MIT.EDU