|Jan/26||Mon||02:00PM-03:30PM||13-2137 von Hippel|
Enrollment: Limited: First come, first served (no advance sign-up)
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be present with practical demonstration. This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
Contact: Yong Zhang, 13-1034, 617 253-5092, YZHANG05@MIT.EDU