Charles Settens, Ph.D., Research Specialist - X-ray Diffraction and Scatteirng
Enrollment: Limited: Advance sign-up required
Sign-up by 01/05
Limited to 12 participants
Attendance: Participants must attend all sessions
Prereq: None
Small-angle X-ray scattering (SAXS) is a well-established characterization method for investigations of materials by probing inhomogeneities in electron density at the nanometer scale. This set of courses is intended to help users acquire (or brush up on) basic knowledge of SAXS and its applications in anticipation for the CMSE SAXS upgrade in Spring 2016.
After a brief review of basic X-ray properties, SAXS instrumentation is examined in detail focusing on the major system components and pointing out differences between lab-based and synchrotron instruments. Implications of the instrument collimation, scattering geometry, sample transmission, sample-detector distance, angular resolution as well as alignment to reduce systematic error in SAXS patterns are discussed. Theoretical elements like scattering lengths and cross sections, coherent/incoherent scattering contributions with example calculations are introduced.
Since most SAXS profiles don't exhibit 'well defined peaks" like crystalline diffraction but instead characteristic "slopes", it is a heavily model-dependent method. After proper data reduction of SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
Contact: Charles Settens, 13-4041, 845-430-2584, settens@mit.edu
| Jan/12 | Tue | 10:00AM-12:00PM | 13-4041 |
This lecture and data analysis training is intended to help users acquire (or brush up on) basic knowledge of SAXS and its applications in anticipation for the CMSE SAXS upgrade in Spring 2016. No laptop required - we will be using SASview 3.1.2. for analysis (open access here: https://github.com/SasView/sasview/releases/ )
Charles Settens, Ph.D. - Research Specialist - X-ray Diffraction and Scatteirng
| Jan/19 | Tue | 10:00AM-12:00PM | 13-4041 |
This lecture and data analysis training is intended to help users acquire (or brush up on) basic knowledge of SAXS and its applications in anticipation for the CMSE SAXS upgrade in Spring 2016. No laptop required - we will be using SASview 3.1.2. for analysis (open access here: https://github.com/SasView/sasview/releases/ )
Charles Settens, Ph.D. - Research Specialist - X-ray Diffraction and Scatteirng