IAP 2016 Activities by Sponsor - Center for Materials Science and Engineering

Libby Shaw, Research Specialist

Jan/19

Tue

02:00PM-05:00PM

Room 13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/15
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers.  This afternoon seminar is a general introduction to two of these techniques:  Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS).  We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.  See also Introduction to Surface Analysis:  Part 2 (Tuesday, January 26).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 617 253-5045, elshaw@mit.edu

Libby Shaw, Research Specialist

Jan/26

Tue

02:00PM-05:00PM

Room 13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/22
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers.  This afternoon seminar introduces a class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces.  With a primary focus on Atomic Force Microscopy, we will summarize the basic mechanism of operation, strengths and limitations of this class of techniques, and some of the research questions SPMs help to answer.  See also Introduction to Surface Analysis:  Part 1 (Tuesday, January 19).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 617-253-5045, elshaw@mit.edu

Tim McClure, Project Technician

Jan/28

Thu

10:00AM-04:00PM

4-159

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/25

The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has just purchased a new ICP-AES. The ICP-AES is used for quantitative elemental analysis. Come find out what it does and how it can help your research.

Refreshments will be served.  Preregister via e-mail to Tim McClure (mtim@mit.edu).

Sponsor(s): Center for Materials Science and Engineering
Contact: Tim MCClure, Room 13-4149, 617-258-6470, mtim@mit.edu

Patrick Boisvert, Technical Associate

Jan/21

Thu

02:00PM-03:00PM

13-2137

Enrollment: Unlimited: No advance sign-up

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.

Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu

Shiahn Chen, Research Specialist

Jan/21

Thu

03:00PM-04:00PM

13-2137

Enrollment: Unlimited: No advance sign-up

This lecture will cover the basic principles of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarities to, the electron-beam instrument. In addition, the lecture will describe the configuration of the FEI Helios 600 Nanolab Dual Beam workstation in the CMSE Electron Microscopy Facility, and conclude with application examples of the material characterization and nanofabrication uses of the dual-beam workstation.

Sponsor(s): Center for Materials Science and Engineering
Contact: Shiahn Chen, 13-1027, 253-4622, schen3j@mit.edu