MIT: Independent Activities Period: IAP

IAP 2016



Adventures in Scanning Electron Microscopy

Donald Galler, Research Engineer

Enrollment: 8 people per session. First come, first serve basis.
Limited to 8 participants
Attendance: Participants welcome at individual sessions
Prereq: None

This class is an introduction to the basic operation of a scanning electron microscope. The basic operating principles will be covered. Attendees will be trained on the use of the microscope.

The microscope is a new JEOL 6610 LV scanning electron microscope (SEM) with several advanced features:

 

This is a training class but anyone interested in these modern research tools is welcome to attend.

Attendees are encouraged to bring samples for exploration and will operate the microscope as part of the class.

 

Enrollment limited: Advance sign up required (contact leader by email). 8 people per session.  First come, first serve basis.

Sponsor(s): Materials Science and Engineering
Contact: Donald Galler, 4-131BA, 617-253-4554, dgaller@mit.edu


Session I

Jan/20 Wed 09:00AM-05:00PM 4-141, 1 hour lunch break

Session Description TBD


Session II

Jan/21 Thu 09:00AM-05:00PM 4-141, 1 hour lunch break

NA


Session III

Jan/22 Fri 09:00AM-05:00PM 4-141, 1 hour lunch break

Session Description TBD