MIT: Independent Activities Period: IAP

IAP 2017

CMSE Introduction to Surface Analysis Part II: Scanned Probe Microscopies

Libby Shaw, Research Specialist

Jan/25 Wed 02:00PM-05:00PM Room 13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/20
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers.  This afternoon seminar introduces a class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces.  With a primary focus on Atomic Force Microscopy, we will summarize the basic mechanism of operation, strengths and limitations of this class of techniques, and some of the research questions SPMs help to answer.  See also Introduction to Surface Analysis:  Part 1 (Wednesday, January 18).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 617-253-5045,