MIT: Independent Activities Period: IAP

IAP 2017

Adventures in Scanning Electron Microscopy

Donald Galler, Research Engineer

Jan/24 Tue 09:00AM-05:00PM 4-141, 1 hour break for lunch
Jan/25 Wed 09:00AM-05:00PM 4-141, 1 hour break for lunch
Jan/26 Thu 09:00AM-05:00PM 4-141, 1 hour break for lunch

Enrollment: Limited: Advance sign-up required
Sign-up by 01/10
Attendance: Repeating event, participants welcome at any session
Prereq: None

This class is an introduction to the basic operation of a scanning electron microscope. The basic operating principles will be covered. Attendees will be trained on the use of the microscope.

The microscope is a new JEOL 6610 LV scanning electron microscope (SEM) with several advanced features:


This is a training class but anyone interested in these modern research tools is welcome to attend.

Attendees are encouraged to bring samples for exploration and will operate the microscope as part of the class.


Enrollment limited: Advance sign up required (contact leader by email). 8 people per session.  First come, first serve basis.

Sponsor(s): Materials Science and Engineering
Contact: Donald Galler, 4-131BA, 617-253-4554,