MIT: Independent Activities Period: IAP

IAP 2017

Introduction to Scanning Electron Microscopy

Patrick Boisvert, Technical Associate

Jan/26 Thu 02:00PM-03:00PM 13-2137

Enrollment: Unlimited: No advance sign-up
Prereq: None

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.

Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, 617-253-3317,