Patrick Boisvert, Technical Associate
| Jan/26 | Thu | 02:00PM-03:00PM | 13-2137 |
Enrollment: Unlimited: No advance sign-up
Prereq: None
The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.
Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, 617-253-3317, pboisver@mit.edu