IAP 2018 Activities by Sponsor - Center for Materials Science and Engineering

Dr. Ken Smith, Applications Scientist at Renishaw

Jan/19

Fri

08:30AM-05:00PM

13-5002

Enrollment: Unlimited: No advance sign-up

The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has a new Raman Microscope available to researchers. Come learn about the many ways Raman can be used.

Sponsor(s): Center for Materials Science and Engineering
Contact: Tim McClure, 13-4149, 8-6470, mtim@mit.edu

Felice Frankel, research scientist

Jan/17

Wed

11:00AM-01:00PM

13-2137

Enrollment: Limited: Advance sign-up required
Sign-up by 01/10
Limited to 15 participants
Prereq: none

Designed after our successful masterclasses on-campus, we will engage in group discussions around YOUR draft figures and suggest various changes to elevate the communicative nature of your figures.  You will be required to submit to Felice ONE draft figure by Jan 10 after you first contact her.

Sponsor(s): Materials Science and Engineering, Center for Materials Science and Engineering
Contact: Felice Frankel, 13-2038, felfra@mit.edu

Libby Shaw, Research Specialist

Jan/19

Fri

02:00PM-05:00PM

13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/15
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers.  This afternoon seminar is a general introduction to two of these techniques:  Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS).  We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.  See also Introduction to Surface Analysis:  Part 2 (Friday, January 26).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 617 253-5045, elshaw@mit.edu

Libby Shaw, Research Specialist

Jan/26

Fri

02:00PM-05:00PM

13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/23
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers.  This afternoon seminar introduces a class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces.  With a primary focus on Atomic Force Microscopy, we will summarize the basic mechanism of operation, strengths and limitations of this class of techniques, and some of the research questions SPMs help to answer.  See also Introduction to Surface Analysis:  Part 1 (Friday, January 19).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 617-253-5045, elshaw@mit.edu

Patrick Boisvert, Technical Associate

Jan/24

Wed

02:00PM-03:00PM

13-2137

Enrollment: Unlimited: No advance sign-up
Prereq: None

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.

Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, 617-253-3317, pboisver@mit.edu

Shiahn Chen, Research Specialist

Jan/24

Wed

03:00PM-04:00PM

13-2137

Enrollment: Unlimited: No advance sign-up
Prereq: None

This lecture will cover the basic principles of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarities to, the electron-beam instrument. In addition, the lecture will describe the configuration of the FEI Helios 600 Nanolab Dual Beam workstation in the CMSE Electron Microscopy Facility, and conclude with application examples of the material characterization and nanofabrication uses of the dual-beam workstation.

Sponsor(s): Center for Materials Science and Engineering
Contact: Shiahn Chen, 13-1027, 253-4622, schen3j@mit.edu