Care and Feeding of a STEM: Use of the HB603 FEG-STEM in CMSE's Electron Microscopy Shared Experimental Facility
Anthony J. Garratt-Reed
Tue, Thu, Jan 5, 7, 12, 14, 19, 21, 26, 28, 09:30am-04:30pm, 13-1026
Enrollment limited: advance sign up required (see contact below)
Limited to 6 students.
Participants requested to attend all sessions (non-series)
Signup by: 30-DEC-98
For those who intend to use the VG HB603 field-emission scanning electron microscope in the course of their research. It would be best to bring your own sample, but doing so is not mandatory. Instruction will cover hardware, theory of electron beam formation, energy-dispersive X-ray analysis, energy-loss spectroscopy, and operation of the STEM. At the end of the course, students should be close to being qualified self-users of the microscope.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Tue Jan 19, Wed Jan 20, Thu Jan 21, Fri Jan 22, 09am-12:00pm, 13-1025
Enrollment limited: advance sign up required (see contact below)
Limited to 5 students.
Participants requested to attend all sessions (non-series)
Signup by: 08-JAN-99
A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Environmental Scanning Electron Microscopy (ESEM) Introduction
David Bell
Mon Jan 11, Tue Jan 12, Wed Jan 13, Thu Jan 14, 01-05:00pm, 13-1012
Enrollment limited: advance sign up required (see contact below)
Limited to 15 students.
Participants requested to attend all sessions (non-series)
Signup by: 06-JAN-99
The ESEM is a unique tool that can be used to image biological and materials specimens with very little sample preparation. This introduction covers the instrument and theory of its operation. The lecture includes ESEM operation, limitations, explanation of imaging technology, and comments on possible applications of the instrument. One lecture is followed by hands-on instruction in the Center's Electron Microscopy Shared Experimental Facility.
Contact: David Bell, 13-1018, x3-3317, dcb@mit.edu
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Fourier Transform Infrared Spectroscopy and Microspectroscopy at CMSE
Tim McClure
Wed Jan 27, 10am-03:00pm, 13-2137
No limit but advance sign up required
Single session event
Signup by: 05-JAN-99
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has a state-of-the-art FTIR spectrometer and microscope for the use of MIT researchers. There will be presentations on the applications of FTIR analysis and the various measurement techniques available. As time permits, attendees will be allowed to analyze their own samples with the assistance of an instructor.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Introduction to Surface Analysis
Libby Shaw
Thu, Jan 21, 28, 02-05:00pm, 13-2137
No limit but advance sign up required
Participants requested to attend all sessions (non-series)
Signup by: 15-JAN-99
A general introduction to several useful techniques for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. Methods discussed: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM).
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy (TEM)
Mike Frongillo
Mon Jan 11, Tue Jan 12, Wed Jan 13, Thu Jan 14, Fri Jan 15, 09am-12:00pm, 13-1024
Enrollment limited: advance sign up required (see contact below)
Limited to 5 students.
Participants requested to attend all sessions (non-series)
Signup by: 08-JAN-99
The first session consists of a lecture on the basics of transmission electron microscopy and how to align and operate the instrument. The class will be assigned time slots so that each individual will be able to learn how to operate the microscope. You may bring your own samples, or samples will be provided for you. This class is intended for new users of the TEM.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Introduction to X-ray Diffraction and X-ray Diffraction Methods
Joe Adario
Tue Jan 19, 10am-04:00pm, 13-5002, Demonstration in 13-4027
Enrollment limited: advance sign up required (see contact below)
Limited to 15 students.
Single session event
Signup by: 04-JAN-99
This seminar will introduce you to an analytical tool used to identify the atomic arrangement of elements and their compounds. Demonstrations will be held in the X-ray Diffraction Laboratory in the afternoon from 1-4 pm, following the morning lecture. Topics to be covered include single crystal diffraction and polycrystalline diffraction. Preregister via e-mail. Registration will be confirmed via e-mail by Jan. 8.
Contact: Joe Adario, 13-4009A, x3-6887, jadario@mit.edu
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Magnetism and Magnetic Property Measurement: Operation of SQUID Magnetometer
Dr. Fangcheng Choou
Fri Jan 15, 10am-12:00pm, 13-2137
No limit but advance sign up required
Single session event
Signup by: 14-JAN-99
Basics of magnetism of materials and principles of SQUID magnetometer operation will be discussed. The main theme will be how to use the SQUID magnetometer to investigate the magnetism of a wide variety of materials. Will include a demonstration.
Contact: Dr. Fangcheng Chou, 13-3134, x3-0054, fcchouWmit.edu@mit.edu
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Thermal Analysis Capability at CMSE
Tim McClure
Wed Jan 20, 10am-03:00pm, 13-2137
No limit but advance sign up required
Single session event
Signup by: 05-JAN-99
The Center for Materials Science and Engineering Analysis Shared Experimental Facility has an assortment of thermal analysis equipment available for use by MIT researchers. There will be presentations on the applications and various techniques associated with thermal analysis. As time permits, attendees will be allowed to analyze their own samples, with the assistance of an instructor.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Topics in Electron Microscopy: A Series of Lectures/Discussions on Various Topics Related to the Use of Electron Microscopes
Anthony J. Garratt-Reed , David Bell
No enrollment limit, no advance sign up
Participants welcome at individual sessions (series)
Presentations will be aimed at students and researchers who are beginning (or expect to begin) to use electron microscopy techniques to solve problems in materials science. They may also be of interest to students who wish to broaden their knowledge of these methods. Sessions will consist of lectures, followed by open discussion, and are intended to complement hands-on instruction offered in other CMSE electron microscopy courses.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
The Basic TEM
Anthony J. Garratt-Reed , David Bell
Wed Jan 6, 03-05:00pm, 13-2137
High-resolution Imaging in the TEM
Anthony J. Garratt-Reed , David Bell
Fri Jan 8, 03-05:00pm, 13-2137
Introduction to Electron Diffraction
Anthony J. Garratt-Reed , David Bell
Wed Jan 13, 03-05:00pm, 13-2137
Electron Energy-loss Spectroscopy in the STEM
Anthony J. Garratt-Reed , David Bell
Fri Jan 15, 03-05:00pm, 13-2137
Energy-dispersive X-ray Analysis (EDX) in the STEM
Anthony J. Garratt-Reed , David Bell
Wed Jan 20, 03-05:00pm, 13-2137
Imaging and EDX Analysis in the SEM
Anthony J. Garratt-Reed , David Bell
Fri Jan 22, 03-05:00pm, 13-2137
Image Recording and Reproduction (Silver-based and Digital)
Anthony J. Garratt-Reed , David Bell
Wed Jan 27, 03-05:00pm, 13-2137
Introduction to Image Analysis and Image Simulation
Anthony J. Garratt-Reed , David Bell
Fri Jan 29, 03-05:00pm, 13-2137
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