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Dr. Gregory S. Blackman
DuPont
Greg is a member of the Corporate Center for Analytical Science in DuPont’s
Central Research and Development Division located in Wilmington Delaware. He
joined DuPont in 1990 and is a leader in the application of Scanning Probe microscopy
to materials and polymer research problems. Greg’s background is in Physics
and Chemistry. He received a double bachelor’s of Science from Shippensburg
University in 1982, followed by a Ph.D. in chemistry from Berkeley in 1988. In
Graduate school, Greg studied Surface and Interfacial Chemistry with Gabor Somorjai.
In 1988, Greg accepted a post-doctoral position with IBM
Almaden research center, where he learned the craft of
a newly invented technology called Atomic Force
Microscopy. Greg founded the Corporate Analytical Scanning Probe Microscopy lab
shortly after he joined DuPont in 1990. Over the years, Greg has been active
in shaping the new field of Scanning Probe both within and outside of DuPont.
Particular interests lie in using SPM to obtain micro-chemical information about
material surfaces, nano-mechanical characterization of polymers and biopolymers,
and nano-electrical characterization. With collaborators from DuPont’s
performance coatings business, Greg developed a NanoScratch tester that has become
a world wide standard for mar performance of automotive coatings. He has been
involved in many multidisciplinary efforts in nano and biotechnology at DuPont.
Greg is a leader of DuPont’s Nanocharacterization group and is currently
exploring methods for structural, chemical, mechanical and electrical characterization
of materials on the nano-scale.
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