President, Optikos Corp.
This presentation will review the specific challenges addressed, and solutions developed, during the design of two very different optical metrology instruments — one a surface topography measurement tool for the contact lens industry that provides rapid measurement to interferometric accuracy in an interferometer-hostile environment, and the second a system for assessing the imaging quality and focus of large tracking telescopes used to image and monitor rocket launches. These challenges are at opposite poles of metrology instrumentation development — one addressing high volume measurement of components used in manufacturing low-cost consumer products — the other assessing the performance of an individual instrument (telescope and camera) on a relatively infrequent but high priority basis. In both cases, the opto-mechanical design challenges are demanding, and they required the development of novel metrology techniques and clever optical and mechanical designs.
Stephen Fantone is the founder and president of Optikos Corp., an engineering firm that manufactures optical instrumentation and test equipment; and develops optically based industrial, medical, and consumer products. Stephen graduated from MIT in ‘74 with degrees in Electrical Engineering and Management. He received a Ph.D. from the Institute of Optics at the University of Rochester. He then worked in the Optical Engineering Department at Polaroid Corp. In 1982 he founded Optikos Corp. Until its sale to Teledyne Technologies, Inc. earlier this year, Stephen was the Chairman of Benthos, Incorporated, a company involved in oceanographic instrumentation and package inspection. He is a Senior Lecturer at the MIT Department of Mechanical Engineering (MIT), the Treasurer and a director of the Optical Society of America, and a director of Rofin-Sinar Technologies, Inc. He was a Hertz Fellow and is a Fellow of the Optical Society of America. He has over 60 US patents.