Osama M. Nayfeh's Publications
19) O.M. Nayfeh, D.A. Antoniadis, S. Boles, C. Ho, and and C.V. Thompson
"Formation of Single Tiers of Bridging Silicon Nanowires for Transistor Applications Using Vapor-Liquid-Solid Growth from
Short Silicon-on-Insulator Sidewalls, " Submitted to Small (2009),
18) O.M. Nayfeh, C. Ni Chleirigh, D.A. Antoniadis, and J.L.
Hoyt
"Strained Si1-xGex/Si Band-to-Band Tunneling Transistors , " Government Microcircuit
Applications and Critical Technology (GOMAC),
(2009)
17) A. Khakifirooz, O.M. Nayfeh, and D.A. Antoniadis
"A Simple Semi-Empirical Short-Channel MOSFET Current-Voltage Model Continuous Across all Regions of
Operation and Employing Only Physical Parameters , "
Submitted to IEEE Transactions on Electron Devices (2009)
16) O.M. Nayfeh, J.L.
Hoyt and D.A. Antoniadis
"Strained Si1-xGex/Si Band-to-Band Tunneling Transistors: Impact of Tunnel-Junction Germanium Composition and
Doping Concentration on Switching Behavior , "
Submitted to IEEE Transactions on Electron Devices (2009)
15) O.M. Nayfeh, D.A. Antoniadis, K. Mantey, and M.H. Nayfeh
"Uniform Delivery of Silicon Nanoparticles on Device Quality Substrates using Spin-Coating from Isopropyl
Alcohol Colloids, "
Accepted for Publication in Applied Physics Letters(2009)
14) O.M. Nayfeh, C. Ni Chleirigh, J. Hennessy, L. Gomez, J.L. Hoyt and
D.A. Antoniadis
"Design of Tunneling Field Effect Transistors using Strained-Silicon/Strained-Germanium Type II Staggered
Heterojunctions , "
IEEE Electron Device Letters, vol. 29, no.9, pp. 1074-1077 (2008)
13) O.M. Nayfeh, C. Ni Chleirigh, J.L. Hoyt and D.A. Antoniadis
"Measurement of Enhanced Gate-Controlled Band-To-Band Tunneling in Highly Strained Silicon-Germanium Diodes, "
IEEE Electron Device Letters, vol. 29, no.5, pp. 468-470 (2008)
12) O.M. Nayfeh, and D.A. Antoniadis, "Calibrated Hydrodynamic
Simulation
of Deeply Scaled Well-Tempered
Nanowire Field Effect Transistors, " IEEE Simulation of Semiconductor Processes and Devices, pp. 305-308
(2007) 11) O.M. Nayfeh, D.A. Antoniadis, K. Mantey, and M.H. Nayfeh, "Memory
effects in metal-oxide semiconductor capacitors incorporating dispensed highly monodisperse 1 nm Si nanoparticles ", Applied Physics Letters , Volume 90, 153015, (2007) 10) O.M. Nayfeh, D.A. Antoniadis, K. Mantey, and M.H. Nayfeh, "Memory
effects in metal-oxide semiconductor capacitors incorporating dispensed highly monodisperse 1 nm Si nanoparticles ", Device Research Conference, Notre Dame, (2007) 9) D. A. Antoniadis, I. Aberg, C. N. Chleirigh, O. M. Nayfeh, A.
Khakifirooz, and J. L. Hoyt, "Continuous MOSFET performance increase with device scaling: the role of strain and channel material innovation," IBM J. Research Dev., vol. 50, no. 4/5, 2006 8) O.M. Nayfeh, D.A. Antoniadis, K. Mantey, and M.H. Nayfeh, "Towards
MOS
memory devices containing 1 nm silicon nanoparticles," 2006 IEEE Silicon Nanoelectronics Workshop., Honolulu, HI, June 11-12 2006
7) A. Khakifirooz, O. Nayfeh, M. L. Lee, E. Fitzgerald, and D. A.
Antoniadis, "Metal germanide Schottky contacts to relaxed and strained germanium," AVS 52nd Int. Symp. Boston, MA, Oct.
30 - Nov. 4, 2005. 6) M.H. Nayfeh, S. Rao, O.M. Nayfeh, A. Smith, J. Therrien, "UV
photodetectors with thin-film Si nanoparticle active medium" , IEEE Transactions on Nanotechnology, Volume 4, Issue 6,
Nov. 2005, pp. 660 - 668 5) A. Khakifirooz, O. M. Nayfeh, and D. A. Antoniadis, "Assessing the
performance limits of ultra-thin double-gate MOSFETs: silicon vs. germanium," IEEE Int. SOI Conf., pp. 79-80,
Charleston, SC, Oct. 2004. 4) O. M. Nayfeh, S. Yu, and D.A. Antoniadis, "On the Relationship
Between Carrier Mobility and Velocity in Sub-50 nm MOSFETs via Calibrated Monte Carlo Simulation", Proceedings of SISPAD
2004, G. Wachutka and G. Schrag, editors, Springer-Verlag, pp. 117-121, 2004. 3) O.M. Nayfeh, S. Rao, A. Smith, J. Therrien, and M.H. Nayfeh,
"Thin film silicon nanoparticle UV photodetector", IEEE Photonics Technology Letters, Volume 16,
Issue 8, Aug. 2004, pp. 1927 - 1929
2) X. Yi, O. Nayfeh, S.A. Morris, and W.D. O'Brien, Jr.,
"Spatial sampling resolution study on BAI-mode imaging for defect detection", The Journal of the Acoustical Society
of America, Volume 109, Issue 5, May 1, 2001, p.2361
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