Case 6389

Multiscale transient event detector

Keywords:

Current and voltage patterns, appliance energy management, granular energy monitoring, nonintrusive load monitor (NILM)

Applications:

Monitoring of multiple electric loads from a single point

Problem:

Conventional load monitoring schemes require separate metering equipment or connections for every load of interest.

Technology:

The technology is a transient event detector implemented with custom analog hardware and a digital signal processing (DSP) computer. The event detector searches for a time pattern of segments or sections of a complete transient which exhibit significant variation (v-section) in different appliances turned-on, in order to identify shapes, amplitude and duration of transients for various appliances’ loads identification.

Advantages:
  • Applicable to overlapping transients
  • Simplify installation effort
  • Inexpensive power qualty monitoring and for performing critical load diagnostics
  • Can be retrofit to existing installations

Inventors:
  • Prof. Steven B. Leeb (Department of Mechanical Engineering, MIT)
  • Prof. James L. Kirtley Jr. (Department of Electrical Engineering and Computer Science, MIT)

Intellectual Property:

U.S. Patent Number 5,483,153, issued January 9th, 1996

Publications:

Leeb, S.B., Kirtley, J.L., LeVan, M.S., Sweeney, J.P., (1993) “Development and Validation of a Transient Event Detector”, AMP Journal of Technology Vol. 3 November, 1993

Last revised: November 1, 2012

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