Technology Available for Licensing

Case 6389

Multiscale transient event detector

Keywords:

Current and voltage patterns, appliance energy management, granular energy monitoring, nonintrusive load monitor (NILM)

Applications:

Monitoring of multiple electric loads from a single point

Problem:

Conventional load monitoring schemes require separate metering equipment or connections for every load of interest.

Technology:

The technology is a transient event detector implemented with custom analog hardware and a digital signal processing (DSP) computer. The event detector searches for a time pattern of segments or sections of a complete transient which exhibit significant variation (v-section) in different appliances turned-on, in order to identify shapes, amplitude and duration of transients for various appliances’ loads identification.

Advantages:

• Applicable to overlapping transients
• Simplify installation effort
• Inexpensive power qualty monitoring and for performing critical load diagnostics
• Can be retrofit to existing installations

Inventors:

• Prof. Steven B. Leeb (Department of Mechanical Engineering, MIT)
• Prof. James L. Kirtley Jr. (Department of Electrical Engineering and Computer Science, MIT)

Intellectual Property:

U.S. Patent Number 5,483,153, issued January 9th, 1996

Publications:

Leeb, S.B., Kirtley, J.L., LeVan, M.S., Sweeney, J.P., (1993) “Development and Validation of a Transient Event Detector”, AMP Journal of Technology Vol. 3 November, 1993

Please contact: Christopher R. Noble MIT Technology Licensing Officer 1 Cambridge Center, Kendall Square, NE18-501 Cambridge, Massachusetts 02142-1601

Email: crn@mit.edu Tel: 617-253-6966 Fax: 617–258-6790 Website: http://tlo.mit.edu