Transmission Electron Microscopy and Microanalysis: Theory
Anthony J. Garratt-Reed
Wed Jan 9, Fri Jan 11, Wed Jan 16, Fri Jan 18, 03-04:30pm, 13-2137
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
In parallel with M. Frongillo's hands-on class, "Operation of the Transmission Electron Microscope," this offering will present the essential background knowledge TEM users require to make choices about operating conditions, to interpret experimental results, and to identify any possible artifacts or other spurious details. It will cover operating modes of the TEM; differences between a TEM, STEM and SEM; imaging and contrast mechanisms; X-ray analysis in the TEM; taking advantage of digital imaging techniques; beam damage in the TEM; high-resolution imaging, etc. Class is intended for TEM and STEM users or potential users, and assumes a basic understanding of the TEM and how it is operated.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 31-Oct-2001
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