IAP 2013 Activities by Sponsor - Center for Materials Science and Engineering

Dr. Shaoyan Chu

Jan/16

Wed

02:00PM-03:00PM

13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/15

Topics of this training course include the concept of ICP-AES and processes of basic sample preparation, calibration and background correction.

Sponsor(s): Center for Materials Science and Engineering
Contact: Shaoyan Chu, 13-3134, x3-0054, sc79@mit.edu

Tim McClure

Jan/28

Mon

10:00AM-01:00PM

13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/25

The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an extended range FT-IR Microscope with a variety of sampling accessories that are available for the use of researchers. Come find out about the many sampling options now available for FT-IR.  Pre-register via e-mail.

Sponsor(s): Center for Materials Science and Engineering
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu

Patrick Boisvert, Technical Associate

Jan/29

Tue

02:00PM-03:00PM

13-2137

Enrollment: Unlimited: No advance sign-up
Attendance: Repeating event, particpants welcome at any session

The lecture will provide an introduction to the basic principles of Scanning Electron Microscopy with an approach to EDX, EBSD, and BSE.

Sponsor(s): Center for Materials Science and Engineering
Contact: Patrick Boisvert, 13-1018, x3-3317, pboisver@mit.edu

Shiahn Chen, Research Specialist

Jan/29

Tue

03:00PM-04:30PM

13-2137

Enrollment: Unlimited: No advance sign-up
Attendance: Repeating event, particpants welcome at any session

This lecture will cover the basic principles of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarities to, the electron-beam instrument. In addition, the lecture will describe the configuration of the FEI Helios 600 Nanolab Dual Beam workstation in the CMSE Electron Microscopy Facility, and conclude with application examples as well as open discussion of the material characterization and nanofabrication uses of the dual beam workstation.

Sponsor(s): Center for Materials Science and Engineering
Contact: Shiahn Chen, 13-1027, 2534622, schen3j@mit.edu

Libby Shaw

Jan/15

Tue

02:00PM-05:00PM

Room 13-5002

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/11
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Tuesday, January 22).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, x3-5045, elshaw@mit.edu

Libby Shaw

Jan/22

Tue

02:00PM-05:00PM

Room 13-5002

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/18

CMSE's Shared Experimental Facilities include several useful tools for characterizing solid surfaces with a sampling depth of a few atomic layers.  This afternoon seminar introduces a fascinating class of techniques which use a tiny mechanical probe to characterize the topography and material properties of surfaces.  With a primary focus on Atomic Force Microscopy, we will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer.  See also "Introduction to Surface Analysis Part 1 on January 15.

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, 2535045, elshaw@mit.edu