Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Tue Jan 16 thru Fri Jan 19, 09am-01:00pm, 13-1025
Enrollment limited: advance sign up required (see contact below)
Signup by: 08-Jan-2001
Limited to 6 participants.
Participants requested to attend all sessions (non-series)
A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Introduction to Surface Analysis
Elisabeth Shaw
Thu Jan 18, 25, 02-05:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 12-Jan-2001
Participants requested to attend all sessions (non-series)
A general introduction to several useful techniques for looking at the structure and chemical composition of solid surfaces with a sampling depth of a few atomic layers. We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. Methods discussed: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Atomic Force Microscopy (AFM).
Contact: Elisabeth Shaw, 13-4149, x3-5045, elshaw@mit.edu
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Introduction to Transmission Electron Microscopy (TEM)
Mike Frongillo
Mon-Fri, Jan 8-12, 23, 09am-01:00pm, 13-1024
Enrollment limited: advance sign up required (see contact below)
Signup by: 01-Jan-2001
Limited to 4 participants.
Participants requested to attend all sessions (non-series)
The first session consists of a lecture on the basics of transmission electron microscopy and how to align and operate the instrument. The class will be assigned time slots so that each individual will be able to learn how to operate the microscope. You may bring your own samples, or samples will be provided for you. This class is intended for new users of the TEM.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
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Magnetism and Magnetic Property Measurement: Operation of SQUID Magnetometer
Dr.Fangcheng Chou
Fri Jan 26, 10am-12:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 24-Jan-2001
Single session event
Basics of magnetism of materials and principles of SQUID magnetometer operation will be discussed. The main theme will be how to use the SQUID magnetometer to investigate the magnetism of a wide variety of materials. Will include a demonstration.
Contact: Dr.Fangcheng Chou, 13-3134, x3-0054, fcchou@mit.edu
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Mime for the Imaginationally Intrigued
Vladimir Bulovic
Mon, Wed, Fri, Jan 8, 10, 12, 17, 19, 22, 24, 29, 31, 03-04:30pm, Kresge Rehearsal RmB
Enrollment limited: advance sign up required (see contact below)
Signup by: 02-Jan-2001
Limited to 30 participants.
Participants requested to attend all sessions (non-series)
After we are done with you, you will love mimes and, even more, you will love being one! Join the class and explore expression and movement. Learn to express yourself without a single word. In 8 classes we will cover the basic elements of mime. We'll give you walls, leans, ropes, and all the rest you need to be a toasted piece of bread, a cog in a Xerox machine, a fish in the sea looking for trouble. Open your eyes, use your body, and think of the space around you; your imagination will paint the rest.
Contact: Vladimir Bulovic, 13-3138, x3-7012, bulovic@mit.edu
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Raman and FTIR Spectroscopy and Microspectroscopy at CMSE
Tim McClure
Wed Jan 31, 10am-03:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 05-Jan-2001
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has Raman and FTIR spectrometers and microscopes available for the use of MIT researchers. There will be presentations on the applications of Raman and FTIR analysis and the various measurement techniques available. As time permits, attendees will be allowed to analyze their own samples with the assistance of an instructor. Advance signup via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Scanning Electron Microscopy and Microanalysis: Theory
Anthony J. Garratt-Reed
Wed Jan 24, Fri Jan 26, Wed Jan 31, Fri Feb 2, 03-04:30pm, 13-2137
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
In parallel with M. Frongillo's hands-on class, "Operation of the Scanning Electron Microscope," this offering will present the essential background knowledge users require to make choices about operating conditions of the SEM, to interpret the results they obtain from the experiments, and to identify any possible artifacts or other spurious details. It will cover operating modes of the SEM; environmental SEM; X-ray analysis in the SEM; characteristics of SEM images; taking advantage of digital imaging techniques; beam damage in the SEM; image resolution; etc. Class is intended for SEM users or potential users, and assumes a basic understanding of an SEM and how it is operated.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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Thermal Analysis Capability at CMSE
Tim McClure
Wed Jan 24, 01-03:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 05-Jan-2001
Single session event
The Center for Materials Science and Engineering's Analysis Shared Experimental Facility has an assortment of thermal analysis equipment available for use by MIT researchers. There will be presentations on the applications and various techniques associated with thermal analysis. Advance signup via e-mail.
Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu
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Transmission Electron Microscopy and Microanalysis: Theory
Anthony J. Garratt-Reed
Wed Jan 10, Fri Jan 12, Wed Jan 17, Fri Jan 19, 03-04:30pm, 13-2137
No enrollment limit, no advance sign up
Participants requested to attend all sessions (non-series)
In parallel with M. Frongillo's hands-on class, "Operation of the Transmission Electron Microscope," this offering will present the essential background knowledge TEM users require to make choices about operating conditions, to interpret experimental results, and to identify any possible artifacts or other spurious details. It will cover operating modes of the TEM; differences between a TEM, STEM and SEM; imaging and contrast mechanisms; X-ray analysis in the TEM; taking advantage of digital imaging techniques; beam damage in the TEM; high-resolution imaging, etc. Class is intended for TEM and STEM users or potential users, and assumes a basic understanding of the TEM and how it is operated.
Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu
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X-ray Diffraction Demonstrations
Joseph A. Adario
Mon Jan 8, 01-04:00pm, 13-4027
No limit but advance sign up required (see contact below)
Single session event
X-ray diffraction is a nondestructive analytical method used by materials scientists in the physical and biological sciences to characterize the structure of materials at the atomic level. A collimated beam of x-rays is directed to the material to be analyzed. The x-rays diffract into an x-ray detector forming a diffraction pattern. This pattern contains information about the types of atoms present and their locations within the crystalline lattice. The technique is empoyed with both single crystals and polycrystalline materials. Both techniques will be demonstrated. Call to reserve a demo time.
Contact: Joe Adario or Peter Kloumann, 13-4009, 36887,33691, jadario@mit.edu, phbk@mit.edu
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