IAP 2001 Activity

Scanning Electron Microscopy and Microanalysis: Theory Anthony J. Garratt-Reed Wed Jan 24, Fri Jan 26, Wed Jan 31, Fri Feb 2, 03-04:30pm, 13-2137 No enrollment limit, no advance sign up Participants requested to attend all sessions (non-series) In parallel with M. Frongillo's hands-on class, "Operation of the Scanning Electron Microscope," this offering will present the essential background knowledge users require to make choices about operating conditions of the SEM, to interpret the results they obtain from the experiments, and to identify any possible artifacts or other spurious details. It will cover operating modes of the SEM; environmental SEM; X-ray analysis in the SEM; characteristics of SEM images; taking advantage of digital imaging techniques; beam damage in the SEM; image resolution; etc. Class is intended for SEM users or potential users, and assumes a basic understanding of an SEM and how it is operated. Contact: Anthony J. Garratt-Reed, 13-1027, x3-4622, tonygr@mit.edu Sponsor: Center for Materials Science and Engineering Latest update: 30-Oct-2000

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Listing generated: 31-Jan-2001