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IAP 2004 Activity


Characterization of Materials in a High-Resolution Scanning Electron Microscope (SEM)
Mike Frongillo
Mon Jan 12 thru Fri Jan 16, 09am-01:00pm, 13-1025

Enrollment limited: advance sign up required (see contact below)
Signup by: 05-Jan-2004
Limited to 6 participants.
Participants requested to attend all sessions (non-series)

A high-resolution SEM will be used to characterize a variety of materials. A brief lecture will be given on the basics of scanning electron microscopy, with primary emphasis on the hands-on operation of the instrument. You may bring your own samples, or samples will be provided for you.
Contact: Mike Frongillo, 13-1034, x3-5092, frong@mit.edu
Sponsor: Center for Materials Science and Engineering
Latest update: 17-Oct-2003


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IAP Office, Room 7-104, 617-253-1668 | Comments and questions to: iap-www@mit.edu | Last update: 21 August 2003