The success of using thin optics in designing x-ray telescopes has urged researchers to further study the possibilities of improving the technology. Thin glass and silicon substrates used for mirrors and gratings have become the prime candidates for building future telescopes due to their low mass, high strength, and relative homogeneity.

Optics of interest include rectangular (100 mm x 140 mm x 0.4 mm) and circular (dia 100 mm x 0.4mm) geometries. These optics are to be shaped to a global surface warp of less than 500 nm. Analytical and Finite Element Analyses have proven the significant effects of gravity, friction, and thermal mismatch error between substrate and holding device on the deformation of these thin optics leading to inaccurate metrology results.

This project involves the development of a constraint device that minimizes the effects of the different types of loads mentioned above with a target pitch repeatability of 70 arcsec. The device will be used in conjuntion with a Shack-Hartmann surface metrology system to provide accurate and repeatable results.